Measurement method for aviation-specific proximity sensor

ABSTRACT

A measurement method for an aviation-specific inductive proximity sensor (IPS for short) includes steps of: 1) building a measurement circuit, wherein an IPS comprises an internal resistance r and an inductance L; 2) building a look-up table, wherein the step 2) specifically comprises steps of: sampling a first voltage measured value U 1  corresponding to a first constant delay time T 1  with the ADC; sampling a second voltage measured value U 2  corresponding to a second constant delay time T 2  with the ADC; then obtaining voltage discharge formulas U 1 (T 1 , R, r, L) and U 2 (T 2 , R, r, L) of an r-L circuit; and 3) compressing the look-up table, utilizing the compressed look-up table for calculation during measurement. The present invention ensures that the system works within a standard temperature range, and improves measurement stability, reliability, and real-time performance. Furthermore, there is no floating point calculation, which saves CPU or MCU hardware resources.

CROSS REFERENCE OF RELATED APPLICATION

This is a U.S. National Stage under 35 U.S.C. 371 of the International Application PCT/CN2012/072799, filed Mar. 22, 2012.

BACKGROUND OF THE PRESENT INVENTION

1. Field of Invention

The present invention belongs to a field of sensors, relates to driving and detection methods for a passive sensor, and more particularly to driving and detection methods for an aerospace inductive proximity sensor (IPS for short), and an optimization method for calculating inductance values by table look-up, which are in particular applicable to table compression of sampling and calculating a charge-discharge curve of an r-L circuit by table look-up.

2. Description of Related Arts

Because a non-contact IPS has higher reliability and mean time between failures (MTBF for short) than a mechanical displacement switch, the non-contact IPS is increasingly frequently used in aviation electromechanical systems such as various types of aircraft landing gears, passenger and cargo doors, flaps, thrust reversers, etc. Aircraft types involved are large civil aircrafts, transport aircrafts and so on.

Industrial non-contact IPS is usually active, bulky, with thick winding wires, driven by high current for detecting, used for outputting digital switching signals, and relatively easy to use. However, high current driving and controlling methods of the sensor cannot meet the general electromagnetic compatibility standards in aviation field. Therefore, the industrial sensor is not suitable for the field of aviation.

Conventionally, main parts of the aviation non-contact IPS are mainly provided by two companies, namely Crane (USA) and Crouzet (France). Internal structures and principles thereof are the same, and main parameters thereof are similar. The sensor is passive, and an internal circuit structure thereof is simple, which comprises a group of winding coils. Shown in FIG. 1, an equivalent circuit model of the IPS comprises a real part of resistor r and an inductor L in series. An inductance value and current capability of the coil are much smaller than the industrial sensor. Typically, a maximum inductance value is no more than 10 mH; and the current capability of the coil is no more than 20 mA.

Conventionally, there are two main driving and detection methods for the passive non-contact IPS: analog measurement method and digital measurement method.

The analog measurement method comprises steps of: applying pulse excitation to the sensor coil, comparing thresholds of the R-L discharge curve by a comparator for detecting the inductance value, then judging whether a nearby target is moving towards the sensor by comparing the inductance value. The analog measurement method is the most common one, and a circuit thereof is simple and reliable. However, due to a large temperature drift of the resistance inside the sensor, an operating temperature range of the measuring system is small. The contradiction of operating temperature and the measurement accuracy remains to be eliminated.

The digital measurement method typically comprises steps of: applying a sine wave excitation to the sensor circuit, sampling waveforms of voltage and current and applying fast Fourier transform (FFT for short) algorithm for obtaining a phase difference between the voltage and the current, and calculating the sensor inductance L. The temperature drift of the resistance inside the sensor is eliminated by calculating, so as to eliminate measurement errors caused by ambient temperature, and expand the operating temperature range. However, the digital measurement method is poor in stability, liable to be affected by external electromagnetic annoyance, and insufficient in real-time performance

SUMMARY OF THE PRESENT INVENTION

An object of the present invention is to provide an analog-digital mixed measurement method for an aviation-specific IPS to overcome the above disadvantages, wherein the measurement method keeps advantages of two conventional kinds of measurement methods: ensuring that a system works within a standard temperature range; improving measurement stability, reliability, and real-time performance; omitting floating point calculation, and saving CPU or MCU hardware resources. For accurately providing the above method, a specific calculation method for a 2-dimensional look-up table, an evaluation method for quantizing error of a look-up table method, and a method for greatly compressing the look-up table are designed according to the present invention.

Accordingly, in order to accomplish the above object, the present invention provides a measurement method for an aviation-specific IPS, comprising steps of:

1) building a measurement circuit, wherein a IPS comprises an internal resistance r and an inductance L, a value of the internal resistance r increases when environmental temperature increases, a value of the inductance L relates to a distance between the IPS and a metal target; the measurement circuit of the IPS comprises a current-limiting resistance R, the IPS and a controlled switch connected in series; an analog-digital converter (ADC for short) is placed at a voltage measurement node between the current-limiting resistance R and the internal resistance r;

2) building a look-up table, wherein the step 2) specifically comprises steps of: sampling a first voltage measured value U₁ corresponding to a first constant delay time T₁ with the ADC; sampling a second voltage measured value U₂ corresponding to a second constant delay time T₂ with the ADC; then obtaining voltage discharge formulas U₁(T₁, R, r, L) and U₂(T₂, R, r, L) of an r-L circuit, wherein T₁, T₂, and R are constants; uniting the two formulas for building the look-up table of the internal resistance r and the inductance L corresponding to the U₁ and U₂; and

3) compressing the look-up table, utilizing the compressed look-up table for measurement of the IPS: for example, in a 12-bit ADC, a size of a complete 2-dimensional look-up table is 2¹²×2¹²a storage volume thereof is 16 M units. In view of practicability, an effective method for compressing the look-up table must be found for ensuring practicability of the present invention. By taking full advantage of a distribution characteristic of sample values [U₁, U₂] in a real circuit, the look-up table is able to be effectively compressed.

Preferably, in the step 2):

between the first constant delay time T₁ and the second constant delay time T₂, the controlled switch is on, the inductance L slowly discharges through internal and external resistances; at an initial time T₀, the controlled switch is off, then the inductance L is charged, and a current thereof is:

$\begin{matrix} {i = {\frac{U_{\max}}{R + r}\left\lbrack {1 - ^{{- \frac{R + r}{L}} \times T}} \right\rbrack}} & (1) \end{matrix}$

a voltage at the voltage measurement node is:

U=U _(max) −i×R  (2)

therefore:

$\begin{matrix} {U = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T}}} \right\rbrack}} & (3) \end{matrix}$

at the first constant delay time T₁ and the second constant delay time T₂ control the ADC to sample, and the corresponding U₁ and U₂ are:

$\begin{matrix} \left\{ {\begin{matrix} {U_{1} = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T_{1}}}} \right\rbrack}} \\ {U_{2} = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T_{2}}}} \right\rbrack}} \end{matrix}.} \right. & (4) \end{matrix}$

Preferably, the formula (4) is calculated by a least square method comprising steps of:

building an object function:

min:(U ₁ −U ₁(L,r))²+(U ₂ −U ₂(L,r))²  (5)

s.t.1: r>0

s.t.2: L>0

further obtaining:

$\begin{matrix} {{{\min \text{:}\left( {{U_{1}\left( {R + r} \right)} - {U_{\max}\left( {r + {R \times ^{{- \frac{R + r}{K}} \times T_{1}}}} \right)}} \right)^{2}} + \left( {{U_{2}\left( {R + r} \right)} - {U_{\max}\left( {r + {R \times ^{{- \frac{R + r}{L}} \times T_{2}}}} \right)}} \right)^{2}}{{{s.t}{.1}\text{:}r} > 0}{{{s.t}{.2}\text{:}L} > 0}} & (6) \end{matrix}$

wherein a max voltage U_(max) (namely 2 ^(n)−1, n is a resolution of the ADC), the current-limiting resistance R, the first constant delay time T₁ and the second constant delay time T₂ are constants;

it is proved that when applying each group of the sample values [U₁, U₂] obtained at T₁ and T₂ to the formula (4), the formula (4) has only one solution [L, r]; with the formula (6), a numerical solution of the [L, r] is able to be obtained;

and applying each of the sample values in the [U₁, U₂] for respectively calculating and obtaining the numerical solution of the [L, r] corresponding to the [U₁, U₂], in such a manner that the look-up table is obtained.

Preferably, in the step 3):

For practicability, a restriction condition of a physical model of the measurement circuit, which is applied on the [U₁, U₂], should be taken full advantage of, for compressing the look-up table. The above restriction condition comprises:

a) T₁ and T₂ are artificially determined, in such a manner that a restriction condition is T₁<T₂; it is proved that U(T) is a monotone decreasing function, therefore, U₁>U₂; and

b) [L, r] is a distribution parameter in a real physical model and must be a positive real number; it is provable that with restriction of the formula (1), mapping a positive real space of [U₁, U₂] to a space of [L, r] may cause negative numbers or even complex numbers in the [L, r]; however, such [U₁, U₂] will not appear in practical sampling.

By removing points where U₁<U₂, and the obtained [L, r] comprises a negative number or complex number, the scale of the look-up table is able to be decreased.

By applying the U_(max) and the sample values (U₁, T₁) and (U₂, T₂) to the formula (4) and calculating to obtain:

$\begin{matrix} \left\{ \begin{matrix} {L = {- \frac{\left( {R + r} \right) \times T_{1}}{\log \left\lbrack {{\frac{U_{1}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack}}} \\ {L = {- \frac{\left( {R + r} \right) \times T_{2}}{\log \left\lbrack {{\frac{U_{2}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack}}} \end{matrix} \right. & (7) \end{matrix}$

then obtaining

$\begin{matrix} {\left\lbrack {{\frac{U_{1}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack^{(\frac{T_{2}}{T_{1}})} = \left\lbrack {{\frac{U_{2}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack} & (8) \end{matrix}$

wherein R and r are positive real numbers, and T₁<T₂; if the solution [L, r] is a positive real number, then a restriction condition is:

$\begin{matrix} {1 > \left\lbrack {{\frac{U_{1}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack > \left\lbrack {{\frac{U_{2}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack > 0} & (9) \end{matrix}$

which means:

$\begin{matrix} {\left( {2^{n} - 1} \right) > U_{1} > U_{2} > {\frac{\left( {2^{n} - 1} \right)r}{R + r}.}} & (10) \end{matrix}$

According to the above restriction condition, a range of the [U₁, U₂] is determined by an ergodic method, wherein:

in practice, r is a distributed resistance in a wire which increases when the environment temperature increases, a min acceptable value r_(min) is applied to the formula (10) for determining the sample value U₁ and a possible min value U_(1min);

applying the U_(1min) to the formula (8) to obtain:

$\begin{matrix} {U_{2\; \min} = {\frac{\left\lbrack {{\frac{U_{1\; \min}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack^{(\frac{T_{2}}{T_{1}})} + \frac{r}{R}}{\left( {R + r} \right)} \times \left( {2^{n} - 1} \right)R}} & (11) \end{matrix}$

regarding the formula (11) as a function of U_(2min) referring to r, calculating a range of the U_(2min) within a range of the distributed resistance r;

wherein the [U₁, U₂] are positive integers sampled by the ADC; ranges of the U₂ respectively corresponding to U_(1min), U_(1min)+1, U_(1min)+2, U_(1min)+3 . . . U_(1min)+(2^(n)−1) are obtained in sequence by repeating the above method, and a set thereof forms a definition domain of the look-up table;

and applying points in the definition domain of the look-up table to the formula (6) for calculating the corresponding solutions [L, r], so as to obtain the compressed look-up table. Points out of the definition domain will not be obtained in the practical sampling, and do not need to be recorded.

By mathematical analysis of the formula (11), it is concluded that:

after the T₁ and T₂ are determined, a scale of the compressed look-up table is mainly depended on a value of a divider resistance R and a change value of the distributed resistance r within an effective working range of the system.

In practice, a measured object is an induction formed by a winding metal wire, a range of a distributed resistance r thereof is large due to a large temperature drift coefficient, which is unfavorable for compression of the look-up table. Usually, a value of the r is not too high. Therefore, by utilizing divider resistance R with high accuracy, low temperature drift, and a range much larger than the range of the r, a sufficient compression ratio of the look-up table is able to be obtained. Referring to a preferred embodiment, specific values thereof are illustrated.

The present invention is applicable to aviation systems such as landing gears, passenger and cargo doors, flaps, and thrust reversers. With gradual opening of aviation markets, the present invention has a wide application range, great economic benefit and social benefit. Compared with the conventional technologies and products, the present invention has technical advantages, improves MTBF, and increases market share of the IPS products and secondary developed products thereof. At the same time, multi-dimensional look-up table compression method is able to effectively reduce size and cost of related control detection systems, and improve system stability, so as to provide extensive application prospect, economic benefit and social benefit.

These and other objectives, features, and advantages of the present invention will become apparent from the following detailed description, the accompanying drawings, and the appended claims.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a schematic view of an equivalent circuit model of an IPS according to a preferred embodiment of the present invention.

FIG. 2 shows a schematic view of a driving and detection module of the IPS according to the preferred embodiment of the present invention.

FIG. 3 shows a waveform of a circuit output signal of the IPS according to the preferred embodiment of the present invention.

FIG. 4 shows a response waveform of the IPS which is close to a target according to the preferred embodiment of the present invention.

FIG. 5 shows a response waveform of the IPS which is far from the target according to the preferred embodiment of the present invention.

FIG. 6 shows a response waveform of the IPS which is 1 mm-2 mm far from the target according to the preferred embodiment of the present invention.

FIG. 7 shows a discharge curve according to the preferred embodiment of the present invention.

FIG. 8 shows a cluster of curves passing (U₁, T₁) according to the preferred embodiment of the present invention.

FIG. 9 shows a cluster of curves passing (U₂, T₂) according to the preferred embodiment of the present invention.

FIG. 10 shows a restriction condition of r-L according to the preferred embodiment of the present invention.

FIG. 11 shows a restriction condition of r-U₂ according to the preferred embodiment of the present invention.

FIG. 12 shows a cluster of curves of U₂ which have positive real crossover points with a given curve of U₁ according to the preferred embodiment of the present invention.

FIG. 13 shows coordinate mapping according to the preferred embodiment of the present invention.

FIG. 14 shows coordinate mapping according to the preferred embodiment of the present invention.

FIG. 15 shows an effective table area according to the preferred embodiment of the present invention.

FIG. 16 shows a solution of a function L(U₁, U₂) within an effective definition domain according to the preferred embodiment of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

Referring to the drawings, the present invention is further illustrated.

According to the present invention, an internal circuit structure of an IPS is simple, which is formed by a group of metal winding wires. Referring to the FIG. 1, an equivalent circuit model thereof is formed by an internal resistance r in an induction coil and an inductance L connected in series (a parasitic capacitance is ignored). The internal resistance r increases when environmental temperature increases, and a value of the inductance L relates to a distance between the IPS and a metal target. If an external metal target is moving towards the IPS, electromagnetic field distribution around the IPS is greatly changed, and an equivalent induction of the IPS is increased. By driving and detecting an induction value, whether the external metal target is moving towards the IPS is able to be judged.

For example, an induction value of a product of Crouzet changes from 4.5 mH (far) to 5.5 mH (close), which rarely changes with a temperature. A resistance thereof changes with a temperature, and a reference range is 10Ω to 15Ω, which rarely changes with a proximity

By driving the IPS and detecting an inductive reactance of the induction, the proximity is able to be detected.

Accordingly, driving and detecting methods require:

1) a peak of a driving current is no more than 15 mA, wherein a higher current is not able to pass an electromagnetic compatibility test; the peak is no less than 10 mA, a lower current is liable to be interfered by an external electromagnetic environment; and

2) a inductance change rate is 2%; a quantified measurement index of 5% is required; inductance detection accuracy of the system should be 0.1%; and

3) as the change rate of the internal resistance within a standard temperature range is over 60%, an impact of temperature drift on inductance detection must be considered; and

4) for improving system MTBF, hardware resources such as CPU, MCU and DSP are not utilized.

Referring to the FIG. 2, FPGA controlling and driving circuit outputs a 0-5V pulsing signal. A drive circuit outputs a driving signal with an amplitude of 0-5V, a positive bandwidth of 2 ms and a period of 200 Hz. Referring to the FIG. 3, a waveform of the drive circuit output signal is illustrated, wherein the output signal passes through a divider circuit, a filter and a sensor, and grounds through the filter.

If the IPS is close to a target, a waveform detected at a measurement node is as illustrated in the FIG. 4. If the IPS is far from a target, a waveform detected at the measurement node is as illustrated in the FIG. 5. If the IPS is 1 mm-2 mm far from a target, a waveform detected at the measurement node is as illustrated in the FIG. 6.

Two constant delay times are obtained by an ADC for sampling voltage measured values U₁ and U₂ corresponding to the constant delay times T₁ and T₂, and further obtaining two voltage discharge formulas U₁(T₁, R, r, L) and U₂(T₂, R, r, L) of an r-L circuit, wherein T₁, T₂, and R (limiting resistance) are constants; the two formulas are united for solving the internal resistance r and the inductance L.

For building the formulas:

Referring to the FIG. 1, between two measurements, a controlled switch is on, the inductance L slowly discharges through internal and external resistances; at a time T₀, the controlled switch is off, then the inductance L is charged, and a current thereof is:

$\begin{matrix} {i = {\frac{U_{\max}}{R + r}\left\lbrack {1 - ^{{- \frac{R + r}{L}} \times T}} \right\rbrack}} & (1) \end{matrix}$

a voltage at the voltage measurement node is:

U=U _(max) −i×R  (2)

therefore:

$\begin{matrix} {U = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T}}} \right\rbrack}} & (3) \end{matrix}$

the first constant delay time T₁ and the second constant delay time T₂ control the ADC to sample, and the corresponding U₁ and U₂ are:

$\begin{matrix} \left\{ {\begin{matrix} {U_{1} = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T_{1}}}} \right\rbrack}} \\ {U_{2} = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T_{2}}}} \right\rbrack}} \end{matrix}.} \right. & (4) \end{matrix}$

Parameters:

A range of the inductance L is [4.5, 5.5] mH; a range of the internal resistance r is [10, 15]Ω.

U₁ and U₂ are represented by values sampled by a 12-bit ADC, wherein U_(max) is 4095.

According to a current-limiting condition, the limiting resistance R is 230 Ω.

Referring to the FIG. 7, medians of the ranges of the internal resistance r and the inductance L are selected for forming a discharge curve. At a time T₁, the inductance L discharges to 30%. At a time T₂, the inductance L discharges to 60%. T₁ is 10.284 μs, T₂ is 24.287 μs.

It is provable that the formula (4) has only on solution:

after quantifying by the ADC:

$\begin{matrix} {{U\left( {R,T,r,L} \right)} = {\frac{4095}{R + r}\left\lbrack {r + {R \times ^{{- 1}\frac{R + r}{L} \times T}}} \right\rbrack}} & (5) \end{matrix}$

U(R, T, r, L) is a monotone decreasing function about R and T, and also a monotone increasing function about r and L.

Because U(R, T, r, L) is monotonic continuous function, an inverse function thereof exists, and the formula (4) has solutions.

With given (U₁, T₁), the formula (4) is restricted by r and L. A space p is defined as a set of (r_(p), L_(p)) which enables the function U-T to pass (U₁, T₁), as illustrated in the FIG. 8.

A space q is defined as a set of (r_(q), L_(q)) which enables the function U-T to pass (U₂, T₂), as illustrated in the FIG. 9.

The spaces p and q are drawn in an r-L coordinate, as illustrated in the FIG. 10. The U-T curve corresponding to a crossover point of two curves in the FIG. 10 passes (U₁, T₁) and (U₂, T₂) at the same time, is the solution of the function. Because L(r) is monotone, there is at most one crossover point, which means that the formula (4) has at most one solution.

Therefore, the formula (4) has only one solution.

The formula (4) is a transcendental equation, and it is difficult to obtain a analytical solution. However, since the formula (4) has only one solution, a numerical solution satisfying an engineering accuracy requirement is obtained by iteration.

The formula (4) is calculated by a least square method comprising steps of:

min:(U ₁ −U ₁(L,r))²+(U ₂ −U ₂(L,r))²  (6)

s.t.1: r>0

s.t.2: L>0

further obtaining:

$\begin{matrix} {{{\min \text{:}\left( {{U_{1}\left( {R + r} \right)} - {U_{\max}\left( {r + {R \times ^{{- \frac{R + r}{K}} \times T_{1}}}} \right)}} \right)^{2}} + \left( {{U_{2}\left( {R + r} \right)} - {U_{\max}\left( {r + {R \times ^{{- \frac{R + r}{L}} \times T_{2}}}} \right)}} \right)^{2}}{{{s.t}{.1}\text{:}r} > 0}{{{s.t}{.2}\text{:}L} > 0}} & (7) \end{matrix}$

and applying each of the sample values in the [U₁, U₂] for respectively calculating and obtaining the numerical solution of the [L, r] corresponding to the [U₁, U₂], in such a manner that the look-up table is obtained. In practice, the value of L is obtained with U₁ and U₂, so as to define a state of the IPS.

Look-up table compression:

For example, in a 12-bit ADC, a size of a complete 2-dimensional look-up table is 2¹²×2¹², and a storage volume thereof is 16 M units, which means poor practicability.

An effective method for compressing the look-up table must be found for ensuring practicability of the present invention. By taking full advantage of a distribution characteristic of sample values [U₁, U₂] in a real circuit, the look-up table is able to be effectively compressed.

With given (rx, Lx), the only (U₁x, U₂x) is calculated and obtained by the formula (7). Theoretically, there are and only one solution, but the solution is restricted by conditions such as physical models and T₁<T₂.

U(T) is a monotone decreasing function. If T₁<T₂, then U₁>U₂. Supposing that U₁<U₂, the solution of the function should at least comprise a negative number for changing monotone, which is physically unreasonable.

After the formula (5) is converted to an inverse function of U about L:

$\begin{matrix} {\frac{1}{L} = {- \frac{\log \left\lbrack {{\frac{U}{4096R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack}{\left( {R + r} \right) \times T}}} & (8) \end{matrix}$

Therefore, L may be a complex number, unless:

$\begin{matrix} {\left\lbrack {{\frac{U}{4096R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack > 0} & (9) \end{matrix}$

which means:

$\begin{matrix} {U > \frac{4096r}{R + r}} & (10) \end{matrix}$

If (U₁x, U₂x) is improperly given, (rx, Lx) obtained may comprise a negative or even complex number. In fact, physically sampled (U₁, U₂) is certainly reasonable. A restriction relationship exists between U₁ and U₂, in such a manner that (r, L) belongs to a positive real domain. That is to say, a crossover point of the two curves in the FIG. 10 is at a first quadrant of a positive real domain coordinate. (U₁, U₂) out of the restriction will not be obtained in the practical sampling, and do not need to be recorded.

With the sample values (U₁, T₁) and (U₂, T₂), it is obtained that:

$\begin{matrix} \left\{ \begin{matrix} {L = {- \frac{\left( {R + r} \right) \times T_{1}}{\log \left\lbrack {{\frac{U_{1}}{4096R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack}}} \\ {L = {- \frac{\left( {R + r} \right) \times T_{2}}{\log \left\lbrack {{\frac{U_{2}}{4096R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack}}} \end{matrix} \right. & (11) \end{matrix}$

then obtaining

$\begin{matrix} {\left\lbrack {{\frac{U_{1}}{4096R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack^{(\frac{T_{2}}{T_{1}})} = \left\lbrack {{\frac{U_{2}}{4096R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack} & (12) \end{matrix}$

If a set of (U₁, U₂) satisfies both the formulas (10) and (12), the function has a positive real number solution.

According to the formula (12), the given U₁ and r should satisfy a condition of:

$\begin{matrix} {r \geq \frac{U_{1}R}{U_{1} - 4096}} & (13) \end{matrix}$

wherein r_(min) is able to be determined.

After determining the U₁, a restriction relationship of U₂(r) is obtained, as illustrated in the FIG. 11.

U₂(r) is a monotone function, a range thereof is determined by the definition domain of the r. U₂ within the range and the given U₁ both enable a positive real number solution of the function, which is illustrated in the FIG. 12.

Referring to the FIG. 13, essence of look-up calculation is mapping the U₁-U₂ coordinate to the r-L coordinate.

Process A is a physical sampling process. Every point in the r-L coordinate is able to be mapped to the U₁-U₂ coordinate.

Process B is a look-up calculation process. Some points in the U₁-U₂ coordinate are able to be mapped back to the r-L coordinate. Some points in the U₁-U₂ coordinate will fall in other quadrants (negative number) or a 4-dimensional complex space when being mapped to the r-L coordinate.

The r is [10, 15] Ω, the L is [4.5, 5.5] mH; mapping relationship thereof is illustrated in the FIG. 14.

A range of U₁ is determined by the formula (13). With each given U₁, a range of U₂ corresponding to the r within a physical changing range is able to be obtained by the restriction relationship of the formula (12). The range of U₂ is obtained in sequence, and a shadow area in the U₁-U₂ coordinate in the FIG. 14 is determined for obtaining the FIG. 15.

A quantity of units of the look-up table is decreased from 4096*4096 to 9360, which means the look-up table is compressed by 1792 times.

Beneficial effects:

According to the definition domain of (U₁, U₂) in the FIG. 15, the corresponding L is obtained in sequence by the formula (4), and the look-up table is built. Regarding L as a Z axis, an image of the function L(U₁, U₂) within the definition domain is obtained, as shown in the FIG. 16.

After ergodic, a max quantization error of L during looking up is 6.30153 uH, at U₁=2754 and U₂=1644.

It is illustrated that with a 12-bit ADC, measurement accuracy is up to 1%. L is [4.5, 5.5] mH, wherein at least 33 levels of effective resolutions are able to be obtained.

According to the theory of the present invention, driving and detection systems for non-contact IPSs are developed. According to tests, a total measurement error of the system is lower than 1% at a temperature between −55° C. and 125° C.; all detection and calculation are directly processed by a logic device, wherein hardware such as CPU and DSP is not utilized. And the detection and calculation are realized by looking up a 10K look-up table. At the same time, the system has been in accordance with standards of MIL-STD-461F for providing CS114, RE102, and RS103 tests. Results thereof satisfy MIL-STD-461F requirements.

One skilled in the art will understand that the embodiment of the present invention as shown in the drawings and described above is exemplary only and not intended to be limiting.

It will thus be seen that the objects of the present invention have been fully and effectively accomplished. Its embodiments have been shown and described for the purposes of illustrating the functional and structural principles of the present invention and is subject to change without departure from such principles. Therefore, this invention includes all modifications encompassed within the spirit and scope of the following claims. 

What is claimed is:
 1. A measurement method for an aviation-specific inductive proximity sensor (IPS for short), comprising steps of: 1) building a measurement circuit, wherein an IPS comprises an internal resistance r and an inductance L, an value of the internal resistance r increases when environmental temperature increases, a value of the inductance L relates to a distance between the IPS and metal target; the measurement circuit of the IPS comprises a current-limiting resistance R, the IPS and a controlled switch connected in series; an analog-digital converter (ADC for short) is placed at a voltage measurement node between the current-limiting resistance R and the internal resistance r; 2) building a look-up table, wherein the step 2) specifically comprises steps of: sampling a first voltage measured value U₁ corresponding to a first constant delay time T₁ with the ADC; sampling a second voltage measured value U₂ corresponding to a second constant delay time T₂ with the ADC; then obtaining voltage discharge formulas U₁(T₁, R, r, L) and U₂(T₂, R, r, L) of an r-L circuit, wherein T₁, T₂, and R are constants; uniting the two formulas for building the look-up table of the internal resistance r and the inductance L corresponding to the U₁ and U₂; and 3) compressing the look-up table, utilizing the compressed look-up table for calculation during measurement.
 2. The measurement method, as recited in claim 1, wherein in the step 2), between the first constant delay time T₁ and the second constant delay time T₂, the controlled switch is on, the inductance L slowly discharges through internal and external resistances; at an initial time T₀, the controlled switch is off, then the inductance L is charged, and a current thereof is: $\begin{matrix} {i = {\frac{U_{\max}}{R + r}\left\lbrack {1 - ^{{- \frac{R + r}{L}} \times T}} \right\rbrack}} & (1) \end{matrix}$ a voltage at the voltage measurement node is: U=U _(max) −i×R  (2) therefore: $\begin{matrix} {U = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T}}} \right\rbrack}} & (3) \end{matrix}$ the first constant delay time T₁ and the second constant delay time T₂ control the ADC to sample, and the corresponding U₁ and U₂ are: $\begin{matrix} \left\{ \begin{matrix} {U_{1} = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T_{1}}}} \right\rbrack}} \\ {U_{2} = {\frac{U_{\max}}{R + r}\left\lbrack {r + {R \times ^{{- \frac{R + r}{L}} \times T_{2}}}} \right\rbrack}} \end{matrix} \right. & (4) \end{matrix}$ wherein a max voltage U_(max), the current-limiting resistance R, the first constant delay time T₁ and the second constant delay time T₂ are constants; accordingly, the values of the internal resistance r and the inductance L are obtained by calculating.
 3. The measurement method, as recited in claim 2, wherein based on a fact that the formula (4) has only one solution [L, r] with given sample values [U₁, U₂], the solution is obtained by a least square method comprising steps of: building an object function: min:(U ₁ −U ₁(L,r))²+(U ₂ −U ₂(L,r))²  (5) s.t.1: r>0 s.t.2: L>0 further obtaining: $\begin{matrix} {{{\min \text{:}\left( {{U_{1}\left( {R + r} \right)} - {U_{\max}\left( {r + {R \times ^{{- \frac{R + r}{L}} \times T_{1}}}} \right)}} \right)^{2}} + \left( {{U_{2}\left( {R + r} \right)} - {U_{\max}\left( {r + {R \times ^{{- \frac{R + r}{L}} \times T_{2}}}} \right)}} \right)^{2}}{{{s.t}{.1}\text{:}r} > {0{s.t}{.2}\text{:}L} > 0}} & (6) \end{matrix}$ and applying each of the sample values in the [U₁, U₂] for respectively calculating and obtaining a numerical solution of the [L, r] corresponding to the [U₁, U₂], in such a manner that the look-up table is obtained.
 4. The measurement method, as recited in claim 3, wherein the sample values [U₁, U₂] are restricted by a measurement circuit model, and the look-up table is compressed by a method comprising steps of: applying the U_(max) and the sample values (U₁, T₁) and (U₂, T₂) to the formula (4) and calculating: $\begin{matrix} \left\{ \begin{matrix} {L = {- \frac{\left( {R + r} \right) \times T_{1}}{\log \left\lbrack {{\frac{U_{1}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack}}} \\ {L = {- \frac{\left( {R + r} \right) \times T_{2}}{\log \left\lbrack {{\frac{U_{2}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack}}} \end{matrix} \right. & (7) \end{matrix}$ then obtaining $\begin{matrix} {\left\lbrack {{\frac{U_{1}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack^{(\frac{T_{2}}{T_{1}})} = \left\lbrack {{\frac{U_{2}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack} & (8) \end{matrix}$ wherein R and r are positive real numbers, and T₁<T₂; if the solution [L, r] is a positive real number, then a restriction condition is: $\begin{matrix} {1 > \left\lbrack {{\frac{U_{2}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack > \left\lbrack {{\frac{U_{2}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack > 0} & (9) \end{matrix}$ which means: $\begin{matrix} {\left( {2^{n} - 1} \right) > U_{1} > U_{2} > \frac{\left( {2^{n} - 1} \right)r}{R + r}} & (10) \end{matrix}$ according to the above restriction condition, a range of the [U₁, U₂] is determined by an ergodic method, wherein: in practice, r is a distributed resistance in a wire which increases when the environment temperature increases, a min acceptable value r_(min) is applied to the formula (10) for determining the sample value U₁ and a possible min value U_(1min); applying the U_(1min) to the formula (8): $\begin{matrix} {U_{2\; \min} = {\frac{\left\lbrack {{\frac{U_{1\; \min}}{\left( {2^{n} - 1} \right)R}\left( {R + r} \right)} - \frac{r}{R}} \right\rbrack^{(\frac{T_{2}}{T_{1}})} + \frac{r}{R}}{\left( {R + r} \right)} \times \left( {2^{n} - 1} \right)R}} & (11) \end{matrix}$ regarding the formula (11) as a function of U_(2min) referring to r, calculating a range of the U_(2min) within a range of the distributed resistance r; wherein the [U₁, U₂] are positive numbers sampled by the ADC; ranges of the U₂ respectively corresponding to U_(1min), U_(1min)+1, U_(1min)+2, U_(1min)+3 . . . U_(1min)+(2^(n)−1) are obtained in sequence by repeating the above method, and a set thereof forms a definition domain of the look-up table; and applying points in the definition domain of the look-up table to the formula (6) for calculating the corresponding solutions [L, r], so as to obtain the compressed look-up table. 